* Processing from silicon wafer to finished solar cell
                * Emitter formation in diffusion furnaces using POCL3
                * Back side Al/Ag screen printing
                * Front side contacting: * screen printing
                                                    * or fully autiomated grain boundary detection and outlining with dispenser
                                                    * or evaporation and galvanic thickening
 

Loading wafers into quartz boat for POCl-diffusion	Screen printing of Al/Ag-paste on back side	Firing of Al/Ag-paste on back side

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        * Characterisation:
                * Measurement of minority carrier lifetime by photo-conductance decay
                * Automatic detection of grain boundaries by optical means and by LBIC
                * Profiling of sheet resistance of emitter
                * Profiling of voltage across surface area of illuminated solar cell
                * Light-beam induced current measurement with high position resolution for cells with and without front metal contacts
                * Contact resistance measurements of metal fingers
                * Current-voltage characteristics of finished cell
                * Automated daylight logging and artificial illumination of up to 100 Watts modules and detailed IV-analysis
 

Characterisation corner	Lifetime (left) and current-voltage (right) measurement	XYZ-workhorse: Sheet resistance profiling, LBIC profiling, Contact resistance measurements, Surface voltage profiling

LBIC system for cells without front metallisation	Plotting system for detecting grain boundaries and writing metal lines along selected grain boundaries	9 kW Illumination array for testing modules

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Changes 30.March.2004 by J.Summhammer